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Toward development of an ideal X-ray diffractometer sample holder

Published online by Cambridge University Press:  10 January 2013

G. V. Narasimha Rao ,
V. S. Sastry ,
H. S. Gopala Krishana Murthy ,
V. Seshagiri  and
T. S. Radhakrishnan
G. V. Narasimha Rao
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
V. S. Sastry
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
H. S. Gopala Krishana Murthy
Affiliation:
Metkem Silicon Limited, Mettur Dam 636 403, India
V. Seshagiri
Affiliation:
Department of Chemistry, S. K. University, Anantapur, A.P., India
T. S. Radhakrishnan
Affiliation:
Materials Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102, India
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Abstract

A new and improved sample holder for use with powder X-ray diffractometry has been developed. This holder is made from a semiconductor grade silicon single crystal cut perpendicular to the [911] axis, i.e., Si (911). This crystal meets most of the basic requirements of an ideal zero background plate, with practically no interference lines. The pattern obtained, by using this crystal as background plate, is very clean, and even very low-intensity Bragg reflections of samples can be detected easily.

Information

Type
Research Article
Information
Powder Diffraction , Volume 11 , Issue 3 , September 1996 , pp. 200 - 203
Copyright
Copyright © Cambridge University Press 1996

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