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Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

Published online by Cambridge University Press:  10 January 2013

S. Pratapa ,
B. H. O’Connor  and
I-M. Low
S. Pratapa
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
B. H. O’Connor*
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
I-M. Low
Affiliation:
Materials Research Group, Department of Applied Physics, Curtin University of Technology, GPO Box U1987, Perth, WA, Australia 6845
*
b)To whom correspondence should be addressed.
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Abstract

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application—determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

Keywords

Compton scatteringX-ray fluorescence spectrometrymass attenuation correctionsRietveld phase analysisaluminium titanate/zirconia-alumina ceramicfunctionally-graded
Type
Research Article
Information
Powder Diffraction , Volume 13 , Issue 3 , September 1998 , pp. 166 - 170
Copyright
Copyright © Cambridge University Press 1998

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References

Austin, A. E., and Schwartz, C. M. (1953). “The crystal structure of aluminum titanate,” Acta Crystallogr. 6, 812–813.CrossRefGoogle Scholar
Bish, D. L., and Howard, S. A. (1988). “Quantitative phase analysis using the Rietveld method,” J. Appl. Crystallogr. 21, 86–91.CrossRefGoogle Scholar
Hill, R. J., and Howard, C. J. (1987). “Quantitative phase analysis from neutron powder diffraction data using the Rietveld method,” J. Appl. Crystallogr. 20, 467–474.CrossRefGoogle Scholar
Jordan, B., O’Connor, B. H., and Deyu, Li (1990). “Use of Rietveld pattern fitting to determine the weight fraction of crystalline material in natural low quartz specimens,” Powder Diffr. 5, 64–69.CrossRefGoogle Scholar
Lewis, J., Schwarzenbach, D., and Flack, H. D. (1982). “Electric field gradients and charge density in corundum, α-Al 2O 3,”Acta Crystallogr., Sect. A: Cryst. Phys., Diffr., Theor. Gen. Crystallogr. A38, 733–739.CrossRefGoogle Scholar
O’Connor, B. H., and Raven, M. D. (1988). “Application of the Rietveld refinement procedure in assaying powdered mixtures,” Powder Diffr. 3, 2–6.CrossRefGoogle Scholar
O’Connor, B. H., and Chang, W-J. (1985). “Use of primary beam filtration in estimating mass attenuation coefficients by Compton scattering,” Adv. X-Ray Anal. 28, 25–30.Google Scholar
Pratapa, S. (1997). “Synthesis and character of a functionally-graded aluminium titanate/zirconia-alumina composite,” MSc Thesis, Curtin University of Technology, Perth, WA, Australia.Google Scholar
Pratapa, S., O’Connor, B. H., and Low, I. M. (1997). “Phase composition profile character of a functionally-graded Al 2TiO 5/ZrO 2-Al 2O 3 composite,” in Proceedings of the 4th International Symposium on Functionally Graded Materials-FGM’96. Tsukuba, Japan, October 1996 (Elsevier, New York), pp. 367–372.Google Scholar
Smith, D. K., and Newkirk, H. W. (1965). “The crystal structure of baddeleyite (monoclinic ZrO 2) and its relation to the polymorphism of ZrO 2,”Acta Crystallogr. 18, 983–991.CrossRefGoogle Scholar
Tertian, R., and Claisse, F. (1982). Principles of Quantitative X-ray Fluorescence Spectrometry (Heyden, London), p. 31.Google Scholar
Teufer, G. (1962). “The crystal structure of tetragonal ZrO 2,”Acta Crystallogr. 15, 1187.CrossRefGoogle Scholar
Thinh, T. P., and Leroux, J. L. (1979). “New basic empirical expression for computing tables of x-ray mass attenuation coefficients,” X-Ray Spectrom. 8, 85–91.CrossRefGoogle Scholar