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X-ray investigations into silica/silver nanocomposite

Published online by Cambridge University Press:  20 March 2017

K. Dudek*
Affiliation:
Refractory Materials Division in Gliwice, Institute of Ceramics and Building Materials, Gliwice, Poland
J. Podwórny
Affiliation:
Refractory Materials Division in Gliwice, Institute of Ceramics and Building Materials, Gliwice, Poland
M. Dulski
Affiliation:
Institute of Material Science, University of Silesia, Chorzow, Poland
A. Nowak
Affiliation:
A. Chelkowski Institute of Physics, University of Silesia, Katowice, Poland
J. Peszke
Affiliation:
A. Chelkowski Institute of Physics, University of Silesia, Katowice, Poland
*
a)Author to whom correspondence should be addressed. Electronic mail: k.dudek@icimb.pl

Abstract

X-ray diffraction data revealed that the initial SiO2/Ag nanocomposite, manufactured in a chemical synthesis process, is mainly composed of silica in amorphous phase (95.5 wt.%), crystalline Ag with a cubic structure (Fm-3m) and cristobalite (SiO2) with a tetragonal structure (P41212) in the amount of 4.2 and 0.3 wt.%, respectively. High-temperature diffraction data revealed high stability of the SiO2/Ag composite up to 1000 °C. High-temperature X-ray diffraction measurements revealed phase cristallization temperatures of silica at 1060 °C for cristobalite and 1080 °C for tridymite as well as temperature of silver evaporation starting from the composite (ca. 1000 °C). Infrared spectroscopy data confirmed the presence of amorphous matrix with embedded silver ions and crystalline compounds in the form of cristobalite and tridymite without silver after thermal treatment.

Type
Technical Articles
Copyright
Copyright © International Centre for Diffraction Data 2017 

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