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X-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe

Published online by Cambridge University Press:  05 March 2012

S. Pikus ,
E. Olszewska ,
I. Mel’nyk  and
R. E. Gladyshevskii
S. Pikus*
Affiliation:
Department of Crystallography, Faculty of Chemistry, Maria Curie Sklodowska University, Maria Curie-Sklodowska Sqr. 3, 20-031 Lublin, Poland
E. Olszewska
Affiliation:
Department of Crystallography, Faculty of Chemistry, Maria Curie Sklodowska University, Maria Curie-Sklodowska Sqr. 3, 20-031 Lublin, Poland
I. Mel’nyk
Affiliation:
Department of Crystallography, Faculty of Chemistry, Maria Curie Sklodowska University, Maria Curie-Sklodowska Sqr. 3, 20-031 Lublin, Poland
R. E. Gladyshevskii
Affiliation:
Department of Inorganic Chemistry, Ivan Franko National University of Lviv, vul. Kyryl I Mefodiya 6, UA-79005 Lviv, Ukraine
*
a)Electronic mail: stanpik@hermes.umcs.lublin.pl
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Abstract

The structures of SmAlSi and SmAlGe were determined by the powder diffraction method. These compounds have a tetragonal structure of LaPtSi type, which is a ternary substitutional variant of α-ThSi2. Both prototype structures have the same extinction rules, and as a result, the choice of the structural type must be based on very careful examination of the peak intensities. This was done with the aid of a Rietveld refinement, which indicates a better fit of the LaPtSi structure.

Type
Technical Articles
Information
Powder Diffraction , Volume 19 , Issue 4 , December 2004 , pp. 359 - 361
Copyright
Copyright © Cambridge University Press 2004

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