Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-26T09:29:48.211Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray powder diffraction study of defect-tetrahedral structure quaternary compound CuZnGa3Te6

Published online by Cambridge University Press:  06 March 2012

Rashmi
Rashmi*
Affiliation:
X-ray Analysis, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India
*
a)Electronic mail: rashmi@csnpl.ren.nic.in
Get access Rights & Permissions [Opens in a new window]

Abstract

Quaternary compound CuZnGa3Te6 was synthesized by the melt and anneal technique. The defect-tetrahedral structure compound crystallized in the tetragonal unit cell with possible space group I4 and Z=4/3. Complete powder diffraction data were obtained and unit cell parameters a and c, and X-ray density were calculated. These were a=0.5946(2) nm, c=1.1891(5) nm, and Dx=5.81×103 kg/m3.

Keywords

quaternary chalcogenideCuZnGa3Te6defect-tetrahedral structureX-ray diffractionpowder diffraction data
Type
New Diffraction Data
Information
Powder Diffraction , Volume 18 , Issue 3 , September 2003 , pp. 263 - 265
Copyright
Copyright © Cambridge University Press 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

de Wolff, P. M. (1968). “A simplified criterion for the reliability of a powder pattern indexing,” J. Appl. Crystallogr. JACGAR 1, 108–113. acr, JACGAR CrossRefGoogle Scholar
Henry, N. F. M. and Lonsdale, K. (1952). International Tables for X-ray Crystallography, Vol. 1, Symmetry Group (Kynoch, Birmingham).Google Scholar
Parthé, E. (1964). Crystal Chemistry of Tetrahedral Structures (Gordon and Breach, London).Google Scholar
Parthé, E., Yvon, K., and Deitch, R. H. (1969). “The crystal structure of Cu2CdGeTe4 and other quaternary normal tetrahedral structure compounds,” Acta Crystallogr., Sect. B: Struct. Crystallogr. Cryst. Chem. ACBCAR B25, 1164–1174. acb, ACBCAR CrossRefGoogle Scholar
Rashmi, and Suri, D. K. (2000). “X-ray powder diffraction study of CuInSeTe,” Powder Diffr. PODIE2 15, 65–68. pdj, PODIE2 CrossRefGoogle Scholar
Rashmi, and Dhawan, U. (2002). “X-ray powder diffraction study of ZnGa2Te4,” Powder Diffr. PODIE2 17, 41–43. pdj, PODIE2 CrossRefGoogle Scholar
Shay, G. S., and Wernick, T. H. (1975). Ternary Chalcopyrite Semiconductors: Growth, Electronic Properties and Applications (Pergamon, Oxford).CrossRefGoogle Scholar
Smith, G. S., and Snyder, R. L. (1979). “FN: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing,” J. Appl. Crystallogr. JACGAR 12, 60–65. acr, JACGAR CrossRefGoogle Scholar
Zunger, A. (1983). “Order–disorder transformation in ternary tetrahedral semiconductors,” Appl. Phys. Lett. APPLAB 50, 164–166. apl, APPLAB CrossRefGoogle Scholar