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Certification of SRM 640f line position and line shape standard for powder diffraction

Published online by Cambridge University Press:  02 July 2020

David R. Black Open the ORCID record for David R. Black [Opens in a new window] ,
Marcus H. Mendenhall Open the ORCID record for Marcus H. Mendenhall [Opens in a new window] ,
Albert Henins ,
James Filliben  and
James P. Cline
David R. Black*
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
Marcus H. Mendenhall
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
Albert Henins
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
James Filliben
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
James P. Cline
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland20899, USA
*
a)Author to whom correspondence should be addressed. Electronic mail: david.black@nist.gov
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Abstract

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 640f, the seventh generation of this powder diffraction SRM, which is designed to be used primarily for calibrating powder diffractometers with respect to line position; it also can be used for the determination of the instrument profile function. It is certified with respect to the lattice parameter and consists of approximately 7.5 g of silicon powder prepared to minimize line broadening. A NIST-built diffractometer, incorporating many advanced design features, was used to certify the lattice parameter of the Si powder. Both statistical and systematic uncertainties have been assigned to yield a certified value for the lattice parameter at 22.5 °C of a = 0.5431144 ± 0.000008 nm.

Keywords

certificationdiffractometerlattice parameterStandard Reference MaterialX-ray diffraction
Type
Technical Article
Information
Powder Diffraction , Volume 35 , Issue 3 , September 2020 , pp. 156 - 159
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Copyright
Copyright © National Institute of Standards and Technology, 2020. This is a work of the US Government and is not subject to copyright protection within the United States. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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