Hostname: page-component-7dd5485656-wjfd9 Total loading time: 0 Render date: 2025-10-31T03:37:22.206Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Intensities from Fixed and Variable Divergence X-Ray Diffraction Experiments

Published online by Cambridge University Press:  10 January 2013

M.E. Bowden  and
M.J. Ryan
M.E. Bowden
Affiliation:
Chemistry Division, Department of Scientific and Industrial Research, Private Bag, Petone, New Zealand
M.J. Ryan
Affiliation:
Chemistry Division, Department of Scientific and Industrial Research, Private Bag, Petone, New Zealand
Get access Rights & Permissions [Opens in a new window]

Abstract

Diffracted intensities from an X-ray diffractometer operating with fixed or variable divergence slits were compared, following a reported systematic deviation from the theoretical 1/sinθ intensity ratio between these two slit configurations. The theoretical relationship was found to hold over a wide 2θ range provided the anti-scatter slit did not obstruct the beam at higher diffraction angles as the variable slit increased beam divergence. Such obstruction was found to be a possible explanation for the reported deviation.

Information

Type
Research Article
Information
Powder Diffraction , Volume 6 , Issue 2 , June 1991 , pp. 78 - 81
Copyright
Copyright © Cambridge University Press 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Jenkins, R. & Paolini, F.R. (1974). Norelco Reporter 21, 9.Google Scholar
Jenkins, R. & Schreiner, W.N. (1989). Pow. Diff. 4, 74.CrossRefGoogle Scholar
Rietveld, H.M. (1969). J. Appl. Crystallogr. 2, 65.CrossRefGoogle Scholar
Suortti, P. & Jennings, L.D. (1977). Acta. Cryst. A33, 1012.CrossRefGoogle Scholar