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D029 High-Precision Strain Determination of SGOI by High-Resolution In-Plane Diffraction

Published online by Cambridge University Press:  20 May 2016

K. Omote  and
A. Ogi
K. Omote
Affiliation:
Rigaku Corporation, Tokyo, Japan
A. Ogi
Affiliation:
Rigaku Corporation, Tokyo, Japan
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 174
Copyright
Copyright © Cambridge University Press 2005

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