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D087 In-Situ and Real-Time Characterization of MOCVD Growth by X-ray Diffraction

Published online by Cambridge University Press:  20 May 2016

A. Kharchenko ,
J. Bethke ,
J. Woitok ,
K. Lischka ,
A. Bonanni ,
C. Simbrunner  and
H. Sitter
A. Kharchenko
Affiliation:
PANalytical B.V., Almelo, The Netherlands
J. Bethke
Affiliation:
PANalytical B.V., Almelo, The Netherlands
J. Woitok
Affiliation:
PANalytical B.V., Almelo, The Netherlands
K. Lischka
Affiliation:
University of Paderborn, Paderborn, Germany
A. Bonanni
Affiliation:
Johannes Kepler University, Linz, Austria
C. Simbrunner
Affiliation:
Johannes Kepler University, Linz, Austria
H. Sitter
Affiliation:
Johannes Kepler University, Linz, Austria
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 174
Copyright
Copyright © Cambridge University Press 2005

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