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D-11 Measurement and Modeling of Residual Stresses at Microscopic and Mesoscopic Levels Using Micro Raman Spectroscopy and X-ray Diffraction

Published online by Cambridge University Press:  20 May 2016

B. Benedikt ,
M. Lewis  and
P. Rangaswamy
B. Benedikt
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
M. Lewis
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
P. Rangaswamy
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 198
Copyright
Copyright © Cambridge University Press 2004

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