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D-117 Parallel Beam XRD: High Accuracy Data from Powders and Polycrystalline Thin Films—Invited

Published online by Cambridge University Press:  20 May 2016

D. K. Bowen
D. K. Bowen
Affiliation:
Bede Scientific, Inc., Englewood, CO
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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 203
Copyright
Copyright © Cambridge University Press 2004

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