Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-26T08:07:05.951Z Has data issue: false hasContentIssue false
  • English
  • Français

Diffraction Peak Broadening Studies in Al2O3 (Whisker) Composites

Published online by Cambridge University Press:  10 January 2013

C. Balasingh ,
Alias Abuhasan  and
P. K. Predecki
C. Balasingh
Affiliation:
Department of Engineering, University of Denver, Denver, Colorado, 80208, U.S.A.
Alias Abuhasan
Affiliation:
Department of Engineering, University of Denver, Denver, Colorado, 80208, U.S.A.
P. K. Predecki
Affiliation:
Department of Engineering, University of Denver, Denver, Colorado, 80208, U.S.A.
Get access Rights & Permissions [Opens in a new window]

Abstract

Diffraction peak broadening analyses were carried out on diffraction profiles of several reflections from hot-pressed α-Al2O3 containing 29, 18 and 10 volume % β-SiC whiskers. The data were analyzed and compared using four different integral breadth methods for microstrain and crystalline size. All four methods gave comparable results, within an order of magnitude, for the microstrains in each phase: (2-15 × 10−4 for the matrix and (6-19 × 10−4 for the whiskers). Microstrains in both matrix and whiskers decreased with decreasing volume % of whiskers for all four methods. Trends in the crystallite size were less consistent but for the matgrix, an incrfease from ∼665 to 1565Å was found with decreasing whisker content using DeKeijser's method.

Type
Research Article
Information
Powder Diffraction , Volume 6 , Issue 1 , March 1991 , pp. 16 - 19
Copyright
Copyright © Cambridge University Press 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Abuhasan, A., Balasingh, C. & Predecki, P. (To be published). J. Amer. Ceram. Soc.Google Scholar
DeKeijser, Th.H., Langford, J.I., Mittemeijer, E.J., & Vogels, A.B.P. (1982). J. Appl. Crystallogr. 15, 308–314.CrossRefGoogle Scholar
Gupta, R.K. & Anantharaman, Z. 1971. Z. metallkd. 62, 732–735.Google Scholar
Halder, N.C. & Wagner, C.N.J. (1966). Adv. X-Ray Anal. 9, 91–102.Google Scholar
Hseuh, C-H., Becher, P.F., & Angelini, P. (1988). J. Am. Ceram. Soc. 71 [11], 929–933.CrossRefGoogle Scholar
Karasek, K.R., Bradley, S.A., Donner, J.T., Yeh, H.C., Scheinle, J.L., & Fang, H.T. (1989). J. Am. Ceram. Soc. 72[10], 1907–1913.CrossRefGoogle Scholar
Klug, H.P. & Alexander, L.E. (1974). X-Ray Diffraction Procedures, John Wiley & Sons, 661–666.Google Scholar
Langford, J.I. (1980). NBS Special Publication, Accuracy in Powder Diffraction, 567, 255–269.Google Scholar
Langford, J.I. (1978). J. Appl. Crystallogr. 11, 10–14.CrossRefGoogle Scholar
Li, Z. & Bradt, R.C. (1989). J. Am Ceram. Soc. 72[1], 70–77.CrossRefGoogle Scholar
Nandi, R.K. & Gupta, S. (1978). J. Appl. Crystallogr. 11, 6–9.CrossRefGoogle Scholar
Nutt, S.R. (1984) J. Am Ceram. Soc. 67[6], 428–431.CrossRefGoogle Scholar
Predecki, P., Abuhasan, A., & Barrett, C.S. (1988) Adv. X-Ray Anal. 31, 231–244.Google Scholar
Taylor, A. (1961). X-Ray Metallography, John Wiley & Sons, 686–687.Google Scholar