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The electronic age: energy-dispersive X-ray analysis and other modern techniques to the present and beyond

Published online by Cambridge University Press:  15 May 2014

Michael Mantler
Michael Mantler*
Affiliation:
Rigaku Corporation, Tokyo, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: michael.mantler@rigaku.com
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Abstract

This paper summarizes an oral presentation of the same title presented at the occasion of recognizing the “The 100th Anniversary of X-ray Spectroscopy” at DXC 2013. It gives an overview of the development in electronics with focus on (mainly) energy-dispersive X-ray detectors and related data processing. Naturally this has its origin in the early transistors and the first semiconductor junction detectors of the late 1940s. It was followed by refinement of semiconductor detector technology in general and particularly by the invention of Li-drifting and employment of low-noise field effect transistors until such devices matured sufficiently to be marketed by the late 1960s. Further improvement followed in resolution, speed, operability at room temperature, and development of junction arrays with imaging capabilities. An important aspect is the development of related software requiring affordable laboratory computers, programming languages, and databases of fundamental parameters. Today x-ray fluorescence analysis (and not only the energy-dispersive variant) is widely employed as an analytical tool for the traditional technical and industrial applications but notably also, at an expanding rate as well as variety, in other fields including environmental, medical, archaeological, space, arts, and many more.

Keywords

historical x-ray detectorsenergy dispersive x-ray analysisx-ray analytical techniquesfundamental parameters
Type
Technical Articles
Information
Powder Diffraction , Volume 29 , Issue 2 , June 2014 , pp. 127 - 132
Copyright
Copyright © International Centre for Diffraction Data 2014 

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