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Equatorial aberration for powder diffraction data collected by continuous-scan integration of a silicon strip X-ray detector

Published online by Cambridge University Press:  07 September 2021

Takashi Ida Open the ORCID record for Takashi Ida [Opens in a new window]
Takashi Ida*
Affiliation:
Advanced Ceramics Research Center, Nagoya Institute of Technology, Nagoya, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: ida.takashi@nitech.ac.jp
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Abstract

The application of continuous-scan integration to collect X-ray diffraction data with a Si strip X-ray detector (CSI-SSXD) introduces additional effects on the peak shift and deformation of peak shape caused by the equatorial aberration. A deconvolutional method to correct the effects of equatorial aberration in CSI-SSXD data is proposed in this study. There are four critical angles related to the effects of spillover of the incident X-ray beam from the specimen face in the CSI-SSXD data. Exact values of cumulants of the equatorial aberration function are efficiently evaluated by 4 × 4 point two-dimensional Gauss–Legendre integral. A naïve two-step deconvolutional method has been applied to remove the effects of the first and third-order cumulants of the equatorial aberration function from the observed CSI-SSXD data. The performance of the algorithm has been tested by analyses of CSI-SSXD data of three LaB6 powder specimens with the widths of 20, 10, and 5 mm, collected with a diffractometer with the goniometer radius of 150 mm.

Keywords

equatorial aberrationsilicon strip X-ray detector
Type
Proceedings Paper
Information
Powder Diffraction , Volume 36 , Issue 3 , September 2021 , pp. 169 - 175
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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