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F-1 TXRF Trace Element Analysis Applied to Authenticity and Purity Control of Pharmaceutical Samples

Published online by Cambridge University Press:  20 May 2016

H. Stosnach  and
A. Gross
H. Stosnach
Affiliation:
Bruker AXS Microanalysis GmbH, Berlin, Germany
A. Gross
Affiliation:
Bruker AXS Microanalysis GmbH, Berlin, Germany
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 187
Copyright
Copyright © Cambridge University Press 2007

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