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F12 High sensitivity, nondestructive determination of toxic trace heavy metals in food by EDXRF using a high throughput silicon multi-cathode detector

Published online by Cambridge University Press:  20 May 2016

Y. Matoba ,
T. Fukai ,
K. Tamura  and
M. Takahashi
Y. Matoba
Affiliation:
SII NanoTechnology Inc., Shizuoka, Japan
T. Fukai
Affiliation:
SII NanoTechnology Inc., Shizuoka, Japan
K. Tamura
Affiliation:
SII NanoTechnology Inc., Shizuoka, Japan
M. Takahashi
Affiliation:
SII NanoTechnology USA Inc., Northridge, CA
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 177
Copyright
Copyright © Cambridge University Press 2006

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