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F26 Large Area Silicon Drift Detectors for X-ray Spectroscopy

Published online by Cambridge University Press:  20 May 2016

A. Niculae ,
H. Soltau ,
P. Lechner ,
R. Eckhard ,
G. Lutz ,
L. Strüder ,
G. Schaller ,
F. Schopper ,
C. Fiorini  and
A. Longoni
A. Niculae
Affiliation:
PNSensor GmbH, Munich, Germany
H. Soltau
Affiliation:
PNSensor GmbH, Munich, Germany
P. Lechner
Affiliation:
PNSensor GmbH, Munich, Germany
R. Eckhard
Affiliation:
PNSensor GmbH, Munich, Germany
G. Lutz
Affiliation:
MPI Halbleiterlabor, Munich, Germany
L. Strüder
Affiliation:
MPI Halbleiterlabor, Munich, Germany
G. Schaller
Affiliation:
MPI Halbleiterlabor, Munich, Germany
F. Schopper
Affiliation:
MPI Halbleiterlabor, Munich, Germany
C. Fiorini
Affiliation:
Politecnico di Milano, Milano, Italy
A. Longoni
Affiliation:
Politecnico di Milano, Milano, Italy
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 185
Copyright
Copyright © Cambridge University Press 2005

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