Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-15T02:08:10.128Z Has data issue: false hasContentIssue false

F-38 Combination of Scanning Probe Microscope and X-ray Analysis—Invited

Published online by Cambridge University Press:  20 May 2016

K. Tsuji
Affiliation:
Osaka City University, Osaka, Japan
T. Emoto
Affiliation:
Osaka City University, Osaka, Japan
Y. Matsuoka
Affiliation:
Osaka City University, Osaka, Japan
Y. Miyatake
Affiliation:
Unisoku Co., Hirakata, Japan
T. Nagamura
Affiliation:
Unisoku Co., Hirakata, Japan
X. Ding
Affiliation:
Beijing Normal University, Beijing, China

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)