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F53 An XRF Measuring Platform Utilizing a Miniature X-ray Tube and a Silicon PIN Diode Detector

Published online by Cambridge University Press:  20 May 2016

C. Jensen ,
A. Reyes-Mena ,
E. Bard ,
S. Liddiard ,
S. Ogden ,
K. Decker ,
C. Carter  and
M. Moras
C. Jensen
Affiliation:
MOXTEK, Inc., Orem, UT
A. Reyes-Mena
Affiliation:
MOXTEK, Inc., Orem, UT
E. Bard
Affiliation:
MOXTEK, Inc., Orem, UT
S. Liddiard
Affiliation:
MOXTEK, Inc., Orem, UT
S. Ogden
Affiliation:
MOXTEK, Inc., Orem, UT
K. Decker
Affiliation:
MOXTEK, Inc., Orem, UT
C. Carter
Affiliation:
MOXTEK, Inc., Orem, UT
M. Moras
Affiliation:
MOXTEK, Inc., Orem, UT
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 172
Copyright
Copyright © Cambridge University Press 2005

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