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The history of the International Centre for Diffraction Data

Published online by Cambridge University Press:  03 April 2012

Julian Messick
Julian Messick*
Affiliation:
International Centre for Diffraction Data, Newtown Square, Pennsylvania
*
a)Electronic mail: jmesk@comcast.net
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Abstract

The International Centre for Diffraction Data has a colorful history, starting as a small task group of involved and interested scientists and progressing through a number of evolutionary steps that were required to deliver scientific products and services globally. The results of these efforts can be found in numerous scientific publications that focus on basic physics, method development, and analyses of the material identification of solid-state materials. This article examines the evolution of the organization through its members and employees.

Keywords

International Centre for Diffraction DataJoint Committee on Powder Diffraction StandardsJoint Committee on Chemical Analysis by X-ray Diffraction Methods
Type
International Reports
Information
Powder Diffraction , Volume 27 , Issue 1 , March 2012 , pp. 36 - 44
Copyright
Copyright © International Centre for Diffraction Data 2012

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References

Blanton, T. N. (2003). “X-ray Film as a two dimensional detector for x-ray diffraction analysis,” Powder Diffr. 18(2), 91–98.CrossRefGoogle Scholar
Davey, W. P. (1941). “Foreword” to the card file of X-ray diffraction data, Set 1, cards 1–6.Google Scholar
Davey, W. P. (1944). “Foreword” to the First Supplement card file, Supplement Set, cards 1–5 (ASTM, Philadelphia, PA, USA). In later years, this First Supplement later became Set 2 of the Powder Diffraction File.Google Scholar
Davey, W. P. (1945). Alphabetical Index of X-ray Patterns, Covering the First Supplementary Set of Cards (ASTM, Philadelphia, PA, USA).Google Scholar
Davey, W. P. (1952). Alphabetical and Grouped Numerical Index of X-Ray Diffraction Data (ASTM, Philadelphia, PA, USA).Google Scholar
Davey, W. P., Hochgesang, F. P., Stevens, M., and Reed, J. B. (1942). Alphabetical Index of X-ray Diffraction Patterns (ASTM, Philadelphia, PA, USA). This index contained both alphabetical names and formula cross-referenced to cards and the strongest line in the diffraction pattern.Google Scholar
Frevel, L. K. (1965). “Computational aids for identifying crystalline phases by powder diffraction,” Anal. Chem. 37(4), 471–482.Google Scholar
Frevel, L. K., Adams, C. E. and Ruhberg, L. R. (1976). “A fast search-match program for powder diffraction analysis,” J. Appl. Crystallogr. 9, 199–204.CrossRefGoogle Scholar
Hanawalt, J. D. (1986). “Manual search/match methods for powder diffraction in 1986,” Powder Diffr. 1, 7–13. 17.Google Scholar
Hanawalt, J. D. and Rinn, H. W. (1986). “Identification of crystalline materials,” Powder Diffr. 1, 2–6. This is a reprint of the original article written in Industrial and Engineering Chemistry, Analytical Edition (1938), 10, 820–830.Google Scholar
Hanawalt, J. D., Rinn, H. W., and Frevel, L. K. (1938). “Chemical analysis by X-ray diffraction,” Ind. Eng. Chem. Anal. Edn 10(9), 457–512.CrossRefGoogle Scholar
Hubbard, C. R. (2000). “ICDD Reinvented,”; presented at the ICDD Workshop at EPDIC-7, Barcelona, Spain.Google Scholar
Hubbard, C. R. (2001). “NIST/ICDD powder diffraction research: a continuing collaboration for nearly 50 years,” presented at the NIST Centennial Celebration Symposium, American Crystallographic Association, Los Angeles, CA, USA.Google Scholar
Hull, A. W. (1919). “A New Method of Chemical Analysis,” J. Am. Chem. Soc. 41(8), 1168–1175.Google Scholar
PDF (or X-ray Diffraction Card Files) (1941) (ASTM, Philadelphia, PA, USA). The first six cards in each card file contains a short history of the file, the associated organizations of the Joint Committee on Chemical Analysis by X-ray Diffraction Methods, members of the Joint Committee and their affiliations. The original records are kept in the historical archives of the ICDD. For several years after publication of the first card set in 1941, the cards were referred to as “The Cards for the Identification of Crystalline Materials by the Hanawalt X-ray Diffraction Method”.Google Scholar
Jenkins, R. and Smith, D. K. (1996). “The powder diffraction file: past present and future,” J. Res. Natl. Inst. Stand. Technol. 101, 3–20. Available online at http://www.icdd.com/products/ICDD.PDFGoogle Scholar
Johnson, G. G. and Vand, V. (1967), “A computerized powder diffraction identification system,” Ind. Eng. Chem. 59(8), 19–31.Google Scholar
Kabekkodu, S. (2011). “The Powder Diffraction File, PDF-4 + ,” Release 2011 published by the ICDD.Google Scholar
Maguire, T. (2010). Private communication, “The Denver X-Ray Conference,” T. Maguire is Manager of Conference Services as well as Corporate Secretary of the ICDD.Google Scholar
Mighell, A., Gasper, P., and Wong-Ng, W. (2004). “An appreciation, Howard McMurdie remembrance” http://www.icdd.com/profile/whatsnew/mcmurdie-2.htmGoogle Scholar
Nichols, M. C. (1966). “A Fortran II program for the identification of X-ray powder patterns,” UCRL-70078, Lawrence Livermore Laboratory.Google Scholar
Smith, D. K. (1986). “Editor's note and introduction to chemical analysis in X-ray diffraction,” 2, 1.Google Scholar
Swanson, H. E. and Tatge, E. (1953), “Standard X-ray diffraction powder patterns”, United States Department of Commerce, National Bureau of Standards, Circular 539 (1). This National Bureau of Standards Monograph series was published from 1953 until 1985. Later versions were printed under Monograph 25 with successive sections published in each monograph. Numerous editors and research scientists contributed to the monograph series.Google Scholar
Wyman, L. L. (1966–1975). Thesis, JCPDS/ICDD 1966–1975.Google Scholar