Published online by Cambridge University Press: 10 January 2013
The influence of grinding procedures on the intensity and full-width-half-maximum for the 101 line of the X-ray powder diffraction pattern for α-quartz has been investigated using samples of controlled grain size. Data collected on powders obtained by four dry grinding methods show substantial variations (up to 35%) in the quartz diffraction intensities. These variations are evident in the <5 μm size fractions and are attributed to the creation of different thickness of amorphous silica layers on quartz grains by grinding. This result suggests that optimum grinding conditions should be defined for quantitative X-ray diffraction analysis.