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Materials assurance through orthogonal materials measurements: X-ray fluorescence aspects

Published online by Cambridge University Press:  20 June 2017

Mark A. Rodriguez ,
Mark H. Van Benthem ,
Donald F. Susan ,
James J. M. Griego ,
Pin Yang ,
Curtis D. Mowry  and
David G. Enos
Mark A. Rodriguez*
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Mark H. Van Benthem
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Donald F. Susan
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
James J. M. Griego
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Pin Yang
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
Curtis D. Mowry
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
David G. Enos
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185-1411
*
a)Author to whom correspondence should be addressed. Electronic mail: marodri@sandia.gov
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Abstract

X-ray fluorescence (XRF) has been employed as one of several orthogonal means of screening materials to prevent counterfeit and adulterated products from entering the product stream. We document the use of principal component analysis (PCA) of XRF data on compositionally similar and dissimilar stainless steels for the purpose of testing the feasibility of employing XRF spectra to parse and bin these alloys as the same or significantly different alloy materials. The results indicate that XRF spectra can separate and assign alloys via PCA, but that important corrections for detector drift and scaling must be performed in order to achieve valid results.

Keywords

X-ray fluorescencestainless steel alloysprincipal component analysismaterials verification
Type
Technical Articles
Information
Powder Diffraction , Volume 32 , Issue 2 , June 2017 , pp. 124 - 132
Copyright
Copyright © International Centre for Diffraction Data 2017 

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