Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-14T18:02:23.747Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement volume considerations in X-ray microdiffraction stress analysis

Published online by Cambridge University Press:  06 March 2012

I. C. Noyan  and
S. K. Kaldor
I. C. Noyan*
Affiliation:
International Business Machines Corporation, Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598
S. K. Kaldor
Affiliation:
International Business Machines Corporation, Microelectronics Division, Hopewell Junction, New York 12533
*
a)Author to whom correspondence should be addressed; Electronic mail: noyan@us.ibm.com
Get access Rights & Permissions [Opens in a new window]

Abstract

The Lorenz-polarization (LP) factor, which is used for X-ray intensity calculations from polycrystalline materials, contains a term that describes the fraction of diffracting grains in the irradiated sample volume. We present extensions of this term and a series of experiments that tests its applicability. The implications of the analysis on microbeam diffraction are also discussed.

Type
Special Section on Microanalysis
Information
Powder Diffraction , Volume 19 , Issue 2 , June 2004 , pp. 104 - 109
Copyright
Copyright © Cambridge University Press 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bonda, R. N. and Noyan, I. C. (1992). “Effect of specimen size in predicting the mechanical properties of PbSn solder alloys,” in Proc. 42nd ECTC Conf., pp. 552–556.Google Scholar
Bonda, R. N.and Noyan, I. C. (1996). “Effect of specimen size in predicting the mechanical properties of PbSn solder alloys,” IEEE Trans. Compon., Packag. Manuf. Technol., Part A IMTAEZ 19, 208–212. ina, IMTAEZ Google Scholar
Chidambarrao, D., Song, Y. C., and Noyan, I. C. (1997). “Numerical simulation of the X-ray stress analysis technique in polycrystalline materials under elastic loading,” Metall. Mater. Trans. A MMTAEB 28, 2515–2525. mma, MMTAEB Google Scholar
Cullity, B. D. (1978). Elements of X-ray Diffraction, 2nd ed. (Addison-Wesley, Reading, MA), pp. 127–132.Google Scholar
DeAngelis, R. J. (1996). “Grain Size Effects in the Determination of X-ray Pole Figures and Orientation Distribution Functions,” Final Report, Summer Faculty Research Program, Wright Laboratory, Eglin AFB.Google Scholar
Klug, H. P. and Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (Wiley, New York), pp. 143–144.Google Scholar
Noyan, I. C. (1994). “Statistical continuum theory and its effects on X-ray stress/strain analysis,” Proceedings ICRS-4 Conference (Soc. Exp. Mechanics, Bethel, CT), pp. 361–371.Google Scholar
Noyan, I. C. and Cohen, J. B. (1987). Residual Stress Measurement by Diffraction and Interpretation (Springer, New York), pp. 133–136.Google Scholar
Shadanov, H. S. (1935). “Bestimmumg der Kornzahl im bereiche von 1 bis 100 m auf Grund der Debye-Scherrer-Aufnahmen,” Z. Kristallogr. ZEKRDZ 90, 83–91. zek, ZEKRDZ Google Scholar
Taylor, A. (1961). X-ray Metallography (Wiley, New York), pp. 663–674. (A first edition of this book can be downloaded from Project Gutenberg on the web: http://www.archive.org/texts/texts-details-db.php?collection=millionbooks&collectionid=AnIntroductionToXRayMetallography).Google Scholar