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A method for routine comparison of XRPD measurements

Published online by Cambridge University Press:  05 March 2012

Giovanni Berti
Giovanni Berti
Affiliation:
Department of Earth Sciences, University of Pisa, Via S. Maria 53, 56126 Pisa, Italy
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Abstract

This paper outlines some features of diffraction instrumental monitoring (DIM), a method which can prove helpful to evaluate systematic effects from diffraction measurements and facilitate the comparison of results. The work provides some consideration of the significance of the information contained in diffraction patterns and the ability of DIM methods to yield the effective values of instrumental parameters obtained under working conditions.

Type
Technical Articles
Information
Powder Diffraction , Volume 16 , Issue 1 , March 2001 , pp. 1 - 5
Copyright
Copyright © Cambridge University Press 2001

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