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A new methodical approach based on Compton scattering and XRF: quantitative analysis of CO2 and loss on ignition in quicklime

Published online by Cambridge University Press:  20 May 2015

Minoru Inoue ,
Yasujiro Yamada ,
Mao Kitamura ,
Norifumi Gotoh ,
Naoki Kawahara  and
Michael Mantler
Minoru Inoue*
Affiliation:
Rigaku Corporation, 14-8 Akaoji, Takatsuki, Osaka 569–1146, Japan
Yasujiro Yamada
Affiliation:
Rigaku Corporation, 14-8 Akaoji, Takatsuki, Osaka 569–1146, Japan
Mao Kitamura
Affiliation:
Yabashi Industries Co., LTD, 4278-1 Okubo, Akasaka, Ogaki, Gifu 503–2213, Japan
Norifumi Gotoh
Affiliation:
Yabashi Industries Co., LTD, 4278-1 Okubo, Akasaka, Ogaki, Gifu 503–2213, Japan
Naoki Kawahara
Affiliation:
Rigaku Corporation, 14-8 Akaoji, Takatsuki, Osaka 569–1146, Japan
Michael Mantler
Affiliation:
Rigaku Corporation, 14-8 Akaoji, Takatsuki, Osaka 569–1146, Japan
*
a) Author to whom correspondence should be addressed. Electronic mail: m-inoue@rigaku.co.jp
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Abstract

The authors present and discuss a method for simultaneous quantitative analysis of total loss on ignition (LOI) (CO2 + H2O) and CO2 content separate from the LOI, in an industrial environment of quicklime production. Total LOI is determined by the Compton scattered RhKα tube radiation which is used directly in the calibration equation. The resulting calibration curve for LOI, including matrix correction shows an accuracy of 0.15 mass%. The carbon content (CO2) is distinguished from total LOI by measuring CKα radiation, which is possible with the required accuracy by employing a new multilayer analyzer with greatly improved background characteristics. The method aims at high reliability and sample throughput and at becoming a less time-consuming alternative to the conventional method of LOI determination by weighing sequences before and after “ignition” at 1050 °C.

Keywords

XRFquicklimeLOICompton scatteringmultilayer analyzermatrix corrections
Type
Technical Articles
Information
Powder Diffraction , Volume 30 , Issue 2 , June 2015 , pp. 113 - 116
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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References

Kataoka, Y., Kawahara, N., Hara, S., Yamada, Y., Matsuo, T., and Mantler, M. (2006). “Fundamental parameter method using scattering X-rays and Monte Carlo simulation”, in European Conf. on X-ray Spectrometry 2006, Paris, France.Google Scholar
Reynolds, R. C. Jr (1963). “Matrix corrections in trace element analysis by X-ray fluorescence: estimation of the mass absorption coefficient by Compton scattering,” Am. Mineral. 48, 1133–1143.Google Scholar