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New statistical calibration approach for Bruker AXS D8 Discover microdiffractometer with Hi-Star detector using GADDS software

Published online by Cambridge University Press:  29 February 2012

Ralph Rowe
Ralph Rowe*
Affiliation:
Research Division, Canadian Museum of Nature, P.O. Box 3443, Stn. D, Ottawa, Ontario K1P 6P4, Canada
*
a)Electronic mail: rrowe@mus-nature.ca
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Abstract

An additional statistical calibration for the Bruker D8 Discover microdiffractometer is necessary to obtain accurate reproducible 2θ data for cell-refinement work. This new approach uses a graphical mapping method of the 2θ error versus the location of a selected diffraction peak on the detector surface to describe the separate roles of different calibration procedures (rebiasing, flood field, and spatial corrections) and parameters (sample-to-detector distance, x-y center coordinate) in minimizing the error. Optimized parameters are used to obtain the lowest achievable Δ2θ with this setup. Intensity error relative to the position of the diffracted line on the detector was found to be consistent at up to 20% and could not be reduced using any of the investigated techniques and parameters.

Keywords

diffractometer calibrationmicrodiffractometerGADD softwareBruker AXS D8 Discovertwo-dimensional detector correctionimproved cell-refinement
Type
Crystallography Education
Information
Powder Diffraction , Volume 24 , Issue 3 , September 2009 , pp. 263 - 271
Copyright
Copyright © Cambridge University Press 2009

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References

Bruker AXS, Inc. (2001). GADDS Service/Administrator’s Manual (Manual Kit 662-002400) (Madison, Wisconsin).Google Scholar
He, B. B., Preckwinkel, U., and Smith, K. L. (2000). “Fundamentals of two-dimensional X-ray diffraction (XRD2)” in Advances in X-ray Analysis (JCPDS, International Center for Diffraction Data, Swarthmore, PA), Vol. 43, pp. 273–280.Google Scholar
ICDD (1960). Powder Diffraction File No. 10-0173, Natl. Bur. Stand (U.S.), Circ. No. 539 (U.S. GPO, Washington, D.C.), Vol. 9, p. 3.Google Scholar
Jones, R. and Young, R. (2007). “Monthly Calibration of the Hi-Star Detector” (Bruker AXS, Madison, WI), Part No. M88-E01118.Google Scholar
Smith, K. L. (2001). “Pole Figures Using an Area Detector, Revision 2.1” (Bruker AXS, Madison, WI).Google Scholar
Zoltai, T. and Stout, J. H. (1984). ”Mineralogy: Concepts and Principles” (Burgess, Minneapolis), p. 505.Google Scholar