Hostname: page-component-6bb9c88b65-vqtzn Total loading time: 0 Render date: 2025-07-17T20:27:47.293Z Has data issue: false hasContentIssue false
  • English
  • Français

Profiles of CuKα Lines

Published online by Cambridge University Press:  10 January 2013

Ludo K. Frevel
Ludo K. Frevel
Affiliation:
Dow Corning Corporation, Analytical Research, Midland, MI 48640-0995, U.S.A.
Get access Rights & Permissions [Opens in a new window]

Abstract

Accurate, digitized, spectral distribution data are given for CuKα radiation, comprising the profiles of CuKα1, CuKα2 and CuKα3,4. Three consistent analytical procedures are detailed for locating the peak of an X-ray emission line and are found to be superior to the conventional graphical centerline method.

Information

Type
Research Article
Information
Powder Diffraction , Volume 2 , Issue 4 , December 1987 , pp. 237 - 241
Copyright
Copyright © Cambridge University Press 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

Azzolini, A. (1985). Scand. J. Statis. 12, 171–178.Google Scholar
Bearden, J. A. (1933). Phys. 43, 92–97.Google Scholar
Bearden, J. A. (1967). Rev. Mod. Phys. 39, 78–124.CrossRefGoogle Scholar
Berger, H. (1986). X-Ray Spectrom. 15(4), 241–243.CrossRefGoogle Scholar
Bond, W. L. (1960). Acta Ciystallogr. 13, 814–818.CrossRefGoogle Scholar
Compton, A. H. and Allison, S. K. (1935a). X-Rays in Theory and Experiment. 2nd ed., 272. New York: Van Nostrand.Google Scholar
Compton, A. H. and Allison, S. K. (1935b). X-Rays in Theory and Experiment. 2nd ed., 746. New York: Van Nostrand.Google Scholar
Deslattes, R. D. and Henins, A. (1973). Phys. Rev. Lett. 31, 972–975.CrossRefGoogle Scholar
Dumond, J. W. M. and Hoyt, A. (1930). Phys. Rev. 36, 799–807.CrossRefGoogle Scholar
Frevel, L. K., Emge, T. J. and Kistenmacher, T. J. (1983). J. Appl. Crystallogr. 16, 126–132.CrossRefGoogle Scholar
Jauncey, G. E. M. (1922). Phys. Rev. 19, 64–67.CrossRefGoogle Scholar
Ladell, J., Parrish, W. and Taylor, J. (1959). Acta Crystallogr. 12, 561–567.CrossRefGoogle Scholar
Lee, P. L. and Salem, S. I. (1974). Phys. Rev. A10, 2027–2032.CrossRefGoogle Scholar
Sauder, W. C., Huddle, J. R. and Wilson, J. D. (1977). Phys. Lett. 63A. 313–315.CrossRefGoogle Scholar
Sørum, H. and Bremer, J. (1980). J. Appl. Crystalogr. 13, 359–363.CrossRefGoogle Scholar
Thompsen, J. C. (1974). X-Ray Spectroscopy, ed. Azaroff, L. V., 76–132. NY: McGraw-Hill.Google Scholar
Warren, B. E. (1969). X-Ray Diffraction, 68. Reading, MA: Addison-Wesley.Google Scholar
Weisskopf, V. and Wigner, E. (1930). Z. Phys. 63, 54–65.CrossRefGoogle Scholar