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Quick X-ray reflectivity of spherical samples

Published online by Cambridge University Press:  16 April 2013

Krassimir Stoev  and
Kenji Sakurai
Krassimir Stoev*
Affiliation:
AECL – Chalk River Laboratories, Chalk River, Ontario, Canada
Kenji Sakurai
Affiliation:
University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, Japan National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki, Japan
*
a)Author to whom correspondence should be addressed. Electronic mail: stoevk@aecl.ca
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Abstract

Recently, a new experimental setup for quick X-ray reflectivity (q-XRR) measurements was proposed, which is based on simultaneous recording of an X-ray reflectivity curve over all angles of interest. This new setup for q-XRR allows measurements to be done within seconds, thus permitting studies of the time evolution of chemical, thermal, and mechanical changes at the surfaces and interfaces of different materials. Since the q-XRR measurement setup utilizes an extended X-ray source and detector, it is important to develop models and to account for the following two effects: (i) diffuse scattering associated with different points of the source and (ii) sample curvature. Models accounting for both effects are presented, and their influences on interpretation of the q-XRR measurement results are discussed.

Keywords

X-ray reflectivitydiffuse scatteringsample curvature
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Issue 2 , June 2013 , pp. 105 - 111
Copyright
Copyright © International Centre for Diffraction Data 2013 

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