Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-10T14:02:46.293Z Has data issue: false hasContentIssue false
  • English
  • Français

Rietveld refinement of ternary compound Gd117Fe52Ge112

Published online by Cambridge University Press:  01 March 2012

Wei He ,
Jiliang Zhang  and
Lingmin Zeng
Wei He
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China
Jiliang Zhang
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China
Lingmin Zeng
Affiliation:
Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Physics Department, Guangxi University, Nanning, Guangxi, 530004, China
Get access Rights & Permissions [Opens in a new window]

Abstract

A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm3m(#225) and lattice parameter a=28.7680(1) Å. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are Rp=0.099 and Rwp=0.128. X-ray powder diffraction data with the figure of merit F30 of 80.4(30) are also reported.

Keywords

Gd117Fe52Ge112crystal structureRietveld methodX-ray diffraction data
Type
Representative Papers from the Chinese XRD 2006 Conference
Information
Powder Diffraction , Volume 22 , Issue 4 , December 2007 , pp. 312 - 315
Copyright
Copyright © Cambridge University Press 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Materials Data, Inc. (1999). Jade 5.0 (Computer Software), Livermore, CA.Google Scholar
Morozkin, A. V., Seropegin, Y. D., Portnoy, V. K., Sviridov, I. A., and Leonov, A. V. (1998). “New ternary compounds R117Fe52Ge112 (R=Gd, Dy, Ho, Er, Tm) and Sm117Fe52Ge112 of the Tb117Fe52Ge112-type structure,” Mater. Res. Bull.MRBUAC 33, 903–908.Google Scholar
Pecharskii, V. K., Bodak, O. I., Bel’skii, V. K., Stardub, P. K., Mokra, I. R., and Gladyshevskii, E. I. (1987). “Crystal structure of Tb117Fe52Ge112,” KristallografiyaKRISAJ 32, 334–336.Google Scholar
Salamakha, P., Sologub, O., Bocelli, G., Otani, S., and Takabatake, T. (2001). “Dy117Fe52Sn112, a new structure type of ternary intermetallic stannides with a giant unit cell,” J. Alloys Compd.JALCEU 314, 177–180.Google Scholar
Smith, G. S. and Snyder, R. L. (1979). “F N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing,” J. Appl. Crystallogr.JACGAR10.1107/S002188987901178X 12, 60–65.Google Scholar
Young, R. A., Larson, A. C., and Paiva-Santos, C. O. (2000). User’s Guide to Program DBWS-9807a for Rietveld Analysis of X-ray and Neutron Powder Diffraction Patterns with a PC and various other computers, School of Physics, Georgia Institute of Technology, Atlanta, GA.Google Scholar