Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-13T12:42:18.118Z Has data issue: false hasContentIssue false

Searching and Matching of X-Ray Powder Diffraction Patterns Using a Programmable Calculator

Published online by Cambridge University Press:  10 January 2013

Milan Škrobian
Affiliation:
Department of Non-Ferrous Metallurgy, Metallurgical Faculty of the Technical University, Kosice, Czechoslovakia
Tomas Havlik
Affiliation:
Department of Non-Ferrous Metallurgy, Metallurgical Faculty of the Technical University, Kosice, Czechoslovakia
Milan Havlik
Affiliation:
Research Laboratory of Metallic Materials, Technical University, Kosice, Czechoslovakia

Abstract

A simple, practical search/match program, RIFRAN 85, has been written and implemented for the EMG 666B programmable calculator. The computer programs are written in EMG Assembler, which is identical to the assembler language for the Hewlett-Packard 9821 calculator. The EMG 666B is made in Hungary and has 8 kbytes of operational memory. The programs interactively provide qualitative phase analysis of X-ray powder diffraction patterns using standard files collected from published data and stored on a compact magnetic tape cassette. Each standard pattern can comprise up to 35 two-theta — intensity pairs. The identification procedure is based on the comparison of the diffraction data of the standard and of the unknown within limits imposed by user-established match and chemical criteria. This paper describes the algorithm used and the performance of the RIFRAN 85 identification system. The system's operation is illustrated using an example of phase analysis of a mineral sample.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Frevel, L. K.: (1965), Anal. Chan., 37, 471–462.Google Scholar
2.Nichols, M. C.: (1966), UCRI 700 78, Lawrence Livermore Lab.Google Scholar
3.Johnson, G. G., Vand, V.: (1967), Ind. Eng. Chem., 59, 1831.Google Scholar
4.Stewart, J. M. (1978), Twente, 36.Google Scholar
5.Huang, T. C., Parrish, V.: (1982), Adv. X-ray Anal., 25, 213–19.Google Scholar
6.Johnson, G. G.: (1977), Ing: Lab. Systems and Spectroscopy, New York, M. Dekker.Google Scholar
7.Johnson, G. G.: (1981), Acta. Cryst., A 37, C-277.Google Scholar
8.Tian-Hui, Lin, Sai-Zhu, Zhang, Li-Jun, Chen, Xin-Xing, Cai: (1983), J. Appl. Cryst., 16, 150–54.CrossRefGoogle Scholar
9.O'Connor, B. H., Bagliani, F.: (1976), J. Appl. Cryst., 9, 419–23.Google Scholar
10.Fiala, J., Fialova, J.: (1985), Chemické listy, 79, 4857 (Czech text).Google Scholar
11.Schreiner, W. N., Surdukowcki, C, Jenkins, R.: (1982), J. Appl. Cryst., 15, 513–23.CrossRefGoogle Scholar
12.Goehner, R. P., Garbauskas, M. F.: (1984), X-ray Spectrometry, 13, 4, 172–9.Google Scholar
13.Nichols, M. C., Johnson, Q.: (1980), Adv. X-ray Anal., 23, 273–8.Google Scholar
14.Jenkins, R., Hubbard, C. R.: (1979), Adv. X-ray Anal., 22, 133–42.Google Scholar
15.Edmonds, J. W.: (1980), J. Appl. Cryst., 13, 191–2.CrossRefGoogle Scholar
16.Hare, T. M., Russ, J. C., Lanzo, M. J.: (1982) Adv. X-ray Anal. 25, 237–43.Google Scholar
17.Lindsey, J. S., Christenson, C. P., Henslee, W. W.: (1980), Adv. X-ray Anal., 23, 151–63.Google Scholar
18.Škrobian, M., Havlik, T., Havlik, M.: (1985), Hutnicke Listy, 5, 341–43 (Slovak text).Google Scholar
19.Heller, B. A., Taylor, H. F. W.: Crystallographic Data for Calcium Silicates, Her Majesty's Stationery Office, London 1956.Google Scholar
20.Brindley, G. W., Brown, G.: Crystal Structures of Clay Minerals, Mineralogical Society, London 1980.Google Scholar
21.Michejev, V.I.: Rentgenometrioečkij Opredelitel Mineralov, GNTIL, Moskva 1957 (Russian text).Google Scholar