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Standard X-Ray Diffraction Powder Patterns from The JCPDS Research Associateship

Published online by Cambridge University Press:  10 January 2013

Howard F. McMurdie ,
Marlene C. Morris ,
Eloise H. Evans ,
Boris Paretzkin ,
Winnie Wong-Ng  and
Camden R. Hubbard
Howard F. McMurdie
Affiliation:
JCPDS – International Centre fur Diffraction Data
Marlene C. Morris
Affiliation:
JCPDS – International Centre fur Diffraction Data
Eloise H. Evans
Affiliation:
JCPDS – International Centre fur Diffraction Data
Boris Paretzkin
Affiliation:
JCPDS – International Centre fur Diffraction Data
Winnie Wong-Ng
Affiliation:
JCPDS – International Centre fur Diffraction Data
Camden R. Hubbard
Affiliation:
Institute for Materials Science and Engineering, National Bureau of Standards
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The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data, from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement.

Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 3 , September 1986 , pp. 265 - 275
Copyright
Copyright © Cambridge University Press 1986

References

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