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Temperature-dependent structure of an intermetallic ErPd2Si2 single crystal: a combined synchrotron and in-house X-ray diffraction study

Published online by Cambridge University Press:  28 April 2022

Kaitong Sun Open the ORCID record for Kaitong Sun [Opens in a new window] ,
Yinghao Zhu ,
Si Wu ,
Junchao Xia ,
Pengfei Zhou ,
Qian Zhao ,
Chongde Cao  and
Hai-Feng Li
Kaitong Sun
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China Guangdong-Hong Kong-Macao Joint Laboratory for Neutron Scattering Science and Technology, No. 1. Zhongziyuan Road, Dalang, Dongguan 523803, China
Yinghao Zhu
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China Guangdong-Hong Kong-Macao Joint Laboratory for Neutron Scattering Science and Technology, No. 1. Zhongziyuan Road, Dalang, Dongguan 523803, China
Si Wu
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China Guangdong-Hong Kong-Macao Joint Laboratory for Neutron Scattering Science and Technology, No. 1. Zhongziyuan Road, Dalang, Dongguan 523803, China
Junchao Xia
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China
Pengfei Zhou
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China
Qian Zhao
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China
Chongde Cao*
Affiliation:
Research and Development Institute of Northwestern Polytechnical University in Shenzhen, Shenzhen 518057, China School of Physical Science and Technology, Northwestern Polytechnical University, Xi'an 710072, China
Hai-Feng Li*
Affiliation:
Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao SAR 999078, China
*
a)Author to whom correspondence should be addressed. Electronic mail: haifengli@um.edu.mo (H.-F. L.); caocd@nwpu.edu.cn (C. C.)
a)Author to whom correspondence should be addressed. Electronic mail: haifengli@um.edu.mo (H.-F. L.); caocd@nwpu.edu.cn (C. C.)
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Abstract

We have grown intermetallic ErPd2Si2 single crystals employing laser diodes with the floating-zone method. The temperature dependence of the unit-cell parameters was determined using synchrotron and in-house X-ray powder diffraction measurements from 20 to 500 K. The diffraction patterns fit well with the tetragonal I4/mmm space group (No. 139) with two chemical formulae within the unit cell. The synchrotron powder diffraction study shows that the refined unit-cell parameters are a = 4.10320(2) Å, c = 9.88393(5) Å at 298 K and a = 4.11737(2) Å, c = 9.88143(5) Å at 500 K, resulting in the unit-cell volume V = 166.408(1) Å3 (298 K) and 167.517(2) Å3 (500 K). In the whole studied temperature range, no structural phase transition was observed. Upon cooling, the unit-cell parameters a and c are shortened and elongated, respectively.

Keywords

ErPd2Si2structuresynchrotron and in-house X-ray powder diffractionRietveld refinement
Type
Technical Article
Information
Powder Diffraction , Volume 37 , Issue 2 , June 2022 , pp. 91 - 97
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Copyright
Copyright © The Author(s), 2022. Published by Cambridge University Press on behalf of International Centre for Diffraction Data

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Footnotes

*

These authors contributed equally.

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