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Texture Correction in Phase Analysis and Thin Film Studies

Published online by Cambridge University Press:  10 January 2013

V. Valvoda
V. Valvoda
Affiliation:
Charles University, Prague, Ke Karlovu 5, 121 16 Prague 2, Czechoslovakia
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Abstract

A method is presented for correction of integrated X-ray intensities for preferred orientation of crystallites in a spinning specimen. It is based upon direct integration of the data obtainable from pole distribution of a single crystallographic plane. This pole distribution can be determined from measurements on a texture goniometer or, in special cases, from an ω-scan or from intensities of all reflections measured on a powder diffractometer only. The method was tested on four samples of magnesium and magnesium cadmium alloys and applied to hexagonal BN and α-Ti(N) surface layers. The method was developed with regard to application in phase analysis and thin film studies.

Type
Research Article
Information
Powder Diffraction , Volume 1 , Issue 2 , June 1986 , pp. 28 - 32
Copyright
Copyright © Cambridge University Press 1986

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