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Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer

Published online by Cambridge University Press:  01 March 2012

Hagen Stosnach
Hagen Stosnach*
Affiliation:
Röntec GmbH, Berlin, Germany
*
a)Electronic mail: stosnach@roentec.de
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Abstract

Total reflection X-ray fluorescence analysis (TXRF) is an established technique for trace element analysis in various sample types. Restricted in the past to expensive large-scale systems, in this study the capability of a benchtop system for trace element analysis is reported. By analysing various heavy metals in raw and digested sewage as well as mercury in recycling glass, the suitability of the TXRF system for these kinds of applications could be proven. Based on this data, the benefits, disadvantages, and restrictions of the benchtop system in comparison to other trace element techniques like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic adsorption spectroscopy (AAS) are evaluated.

Information

Type
XRD Instrumentation and Techniques
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 141 - 145
Copyright
Copyright © Cambridge University Press 2005

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