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X-ray diffraction studies on the effect of ball-milling speed on the structure of Cu(In,Ga)Se2 nanoparticles

Published online by Cambridge University Press:  07 October 2013

L. Fu ,
Y.Q. Guo  and
S. Zheng
L. Fu
Affiliation:
School of Energy Power and Mechanical Engineering, North China Electric Power University, Beijing 102206, China
Y.Q. Guo*
Affiliation:
School of Energy Power and Mechanical Engineering, North China Electric Power University, Beijing 102206, China
S. Zheng
Affiliation:
School of Energy Power and Mechanical Engineering, North China Electric Power University, Beijing 102206, China
*
a)Author to whom correspondence should be addressed. Electronic mail: yqguo100@yahoo.com.cn
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Abstract

Cu(In,Ga)Se2 (CIGS) semiconductors were prepared by arc melting and the vacuum solid reaction. CIGS nanoparticles were synthesized by the mechanical alloy method. The influences of various ball-milling speeds on phase structures for CIGS nanoparticles were investigated by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The crystal structures and unit-cell parameters of CIGS nanoparticles were determined using TREOR program and the least squares method. A Rietveld structural refinement was used to determine the atomic occupations and atomic numbers of CIGS prepared under various ball-milling speeds. The least size of agglomerated CIGS nanoparticles should be around 200 nm. CIGS nanoparticles milled at various milling speeds with a tetragonal chalcopyrite structure were obtained according to XRD analyses. However, Ga content in CIGS depends on milling speeds. Based on the structural refinements, the unit-cell parameters are a = 5.693(8)–5.744(9) Å and c = 11.334(9)–11.524(4) Å with gallium content ranging from 0.3 to 0.5. The atomic occupations are corresponding to the 4a crystal site for Cu atoms, the 4b site for In and the 8d site for Se. Ga prefers to occupy the 4b crystal site.

Keywords

Cu(In, Ga)Se2CIGSnanoparticlesmechanical millingRietveld refinement
Type
Technical Articles
Information
Powder Diffraction , Volume 28 , Supplement S1 , September 2013 , pp. S28 - S31
Copyright
Copyright © International Centre for Diffraction Data 2013 

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