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X-ray powder diffraction data for the Al3Ho2Si2 ternary compound

Published online by Cambridge University Press:  17 June 2013

Zhao Lu ,
Ming Qin ,
Liuqing Liang ,
Shuhui Liu ,
Caiming Huang ,
Peiling Qing  and
Lingmin Zeng
Zhao Lu
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Ming Qin*
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Liuqing Liang
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Shuhui Liu
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Caiming Huang
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Peiling Qing
Affiliation:
Department of physics and communication engineering, Baise University, Baise, Guangxi 533000, China
Lingmin Zeng
Affiliation:
Institute of Materials Science, Guangxi University, Nanning, Guangxi 530004, China
*
a) Author to whom correspondence should be addressed. Electronic mail: qm6327@sohu.com
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Abstract

Crystal and X-ray powder diffraction data are presented for the Al3Ho2Si2 ternary compound. The powder pattern was indexed and refined on a monoclinic cell with the Al3Y2Si2 structure type with space group C12/m1, a = 10.1096(2) Å, b = 4.020(6) Å, c = 6.5734(6) Å, β = 100.848(2)°, V = 262.37 Å3, Z = 2ρx = 5.910 g cm−3, F30 = 142.8(0.006, 35), and RIR = 0.91.

Keywords

Al3Ho2Si2powder X-ray diffraction
Type
New Diffraction Data
Information
Powder Diffraction , Volume 28 , Issue 4 , December 2013 , pp. 299 - 301
Copyright
Copyright © International Centre for Diffraction Data 2013 

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References

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