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X-ray powder diffraction pattern and crystal structure of AlCu4Y ternary compound

Published online by Cambridge University Press:  29 October 2015

Degui Li ,
Ming Qin ,
Liuqing Liang ,
Changsheng Qin ,
Chenzhong Jia ,
Lei Hu ,
Bing He  and
Lingmin Zeng
Degui Li
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Ming Qin*
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Liuqing Liang
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Changsheng Qin
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Chenzhong Jia
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Lei Hu
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Bing He
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Lingmin Zeng
Affiliation:
School of Materials Science and Engineering, Guangxi University, Nanning, Guangxi 530004, China
*
a)Author to whom correspondence should be addressed. Electronic mail: qm6327@sohu.com
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Abstract

The ternary compound of AlCu4Y was synthesized by melting under argon atmosphere in the arc furnace. High-quality X-ray powder diffraction data of AlCu4Y have been collected using a Rigaku SmartLab X-ray powder diffractometer. The Rietveld refinement results of the X-ray diffraction pattern for the AlCu4Y compound showed that the AlCu4Y is the hexagonal structure, space-group P6/mmm (No. 191) with a = 5.0658(1) Å, c = 4.1569(1) Å, V = 92.38 Å3, Z = 1, and the density is 6.66 g cm−3, and the intensity ratio RIR is 1.96.

Keywords

AlCu4YX-ray powder diffractioncrystal structureRietveld refinement
Type
New Diffraction Data
Information
Powder Diffraction , Volume 30 , Issue 4 , December 2015 , pp. 362 - 364
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Copyright
Copyright © International Centre for Diffraction Data 2015 

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References

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