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XRD Microstructural Characterization of Tetragonal Pure Zirconia Powders Obtained by Controlled Hydrolysis of Zirconium Alkoxides

Published online by Cambridge University Press:  10 January 2013

P. Scardi
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, 38050 Mesiano, Trento, Italy.
L. Lutterotti
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, 38050 Mesiano, Trento, Italy.
R. Di Maggio
Affiliation:
Dipartimento di Ingegneria dei Materiali, Università di Trento, 38050 Mesiano, Trento, Italy.

Abstract

A new preparation procedure to obtain tetragonal pure zirconia powders is reported together with a detailed analysis of the profile of X-ray Diffraction (XRD) peaks. The crystallization kinetic up to 800°C is described through r.m.s. microstrain and crystallite size distributions. The results of two methods of profile analysis are compared. After thermal treatments up to 100°C the samples of amorphous gel prepared crystallize in the tetragonal structure. The monoclinic phase occurs only above this temperature. Moreover the tetragonal to monoclinic transformation has a strong effect in changing the shape of the distributions. Studying the crystallite size distributions we can infer a critical size of about 300 Å for the tetragonal crystallites to transform. The shape of the mean crystallite of a fully tetragonal sample is also described.

Type
Research Article
Copyright
Copyright © Cambridge University Press 1991

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References

Bansal, G. K. & Heuer, A. H. (1972). Acta Metall. 20, 12811289.Google Scholar
Bansal, G. K. & Heuer, A. H. (1974). Acta Metall. 22, 409417.Google Scholar
Benedetti, A., Fagherazzi, G., Enzo, S. & Battagliarin, M. (1988). J. Appl. Crystallogr. 21, 543549.CrossRefGoogle Scholar
Benedetti, A., Fagherazzi, G. & Pinna, F. (1989). J. Am. Ceram. Soc. 72, 467469.CrossRefGoogle Scholar
Buchanan, D. R., McCullough, R. L., & Miller, R. L. (1966). Acta Crystallogr. 20, 922924.CrossRefGoogle Scholar
Crist, B. & Cohen, J. B. (1979). J. Polym. Sci. 17, 10011010.Google Scholar
Davis, B. H. (1984). J. Am. Ceram. Soc. 67, C168.Google Scholar
Delhez, R., De Keijser, T. H., & Mittemeijer, E. J. (1987). Surface Engineering. 3, 331342.CrossRefGoogle Scholar
Enzo, S., Fagherazzi, G., Benedetti, A., & Polizzi, S. (1988). J. Appl. Crystallogr. 21, 536542.Google Scholar
Fegley, B. Jr & Barringer, E. A. (1984). Am. Ceram. Soc. Bull. 64, 187197.Google Scholar
Fegley, B. Jr., White, P., & Bowen, K. H. (1985). Am. Ceram. Soc. Bull. 64, 11151120.Google Scholar
Garvie, R. C. & Goss, M. F. (1986). J. Mater. Sci. 21, 12531257.CrossRefGoogle Scholar
Guinier, A. (1963). X-Ray Diffraction, p. 139. San Francisco: W.H. Freeman.Google Scholar
Heuer, A. H. (1981). Advances in Ceramics, Science and Technology of Zirconia, edited by Heuer, A. H. & Hobbs, L. W., Vol.3, p. 98. Columbus, Ohio: The American Ceramic Society.Google Scholar
Hugo, G. R., Muddle, B. C., & Hannik, R. H. J. (1988). Mat. Sci. Forum, Vol. 34–36, pp. 165169.Google Scholar
Ingel, R. P., Lewis, D., Bender, B. A., & Rice, R. W. (1983). Advances in Ceramics, Science and Technology of Zirconia II, edited by Claussen, N., Rühle, M. & Heuer, A.H., Vol.12, pp. 408414. Columbus, Ohio: The American Ceramics Society.Google Scholar
Keijser, Th. H. De, Langford, J. I., Mittemeijer, E. J., & Vogels, A. B. P. (1982). J. Appl. Crystallogr. 15, 308314.CrossRefGoogle Scholar
Keijser, Th. H. De, Mittemeijer, E.J., & Rozendaal, H. C. F. (1983). J. Appl. Crystallogr. 16, 309316.CrossRefGoogle Scholar
Klug, H. P. & Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., p. 643. New York: J. Wiley & Sons.Google Scholar
Klug, H. P. & Alexander, L. E. (1974). X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed., p. 661. New York: J. Wiley & Sons.Google Scholar
Kriven, W. M., Fraser, W. L., & Kennedy, S. W. (1981). Advances in Ceramics, Science and Technology of Zirconia, edited by Heuer, A. H. & Hobbs, L. W., Vol.3, pp. 8297. Columbus, Ohio: The American Ceramic Society.Google Scholar
Kundu, P., Pal, D., & Sen, Suchitra (1988). J. Mater. Sci. 23, 15391546.CrossRefGoogle Scholar
Lin, Kwang-Lung & Wang, Heey-Chang (1988). J. Mater. Sci. 23, 36663670.CrossRefGoogle Scholar
Lange, F. F. & Green, D. J. (1981). Advances in Ceramics, Science and Technology of Zirconia, edited by Heuer, A. H. & Hobbs, L. W., Vol.3, pp. 217–25. Columbus, Ohio: The American Ceramic Society.Google Scholar
Lutterotti, L. & Scardi, P. (1990). J. Appl. Crystallogr. 23. 246252.CrossRefGoogle Scholar
Mazdiyasni, K. S. (1984). Mat. Res. Soc. Symp. Proc. 32, 175186.CrossRefGoogle Scholar
Powder Diffraction File (1988). Swarthmore, PA: International Centre for Diffraction Data.Google Scholar
Rao, S. & Houska, C. R. (1986a). Acta Crystallogr. A42, 613.Google Scholar
Rao, S. & Houska, C. R. (1986b). Acta Crystallogr. A42, 1419.CrossRefGoogle Scholar
Rao, S. & Houska, C. R. (1989). Mat. Res. Soc. Symp. Proc. 138, 9397.CrossRefGoogle Scholar
Rothman, R. & Cohen, J. B. (1971). J. Appl. Phys. 42, 971979.CrossRefGoogle Scholar
Rühle, M. & Heuer, A. H. (1983). Advances in Ceramics, Science and Technology of Zirconia II, edited by Claussen, N., Rühle, M. & Heuer, A. H., Vol. 12, pp. 1432. Columbus, Ohio: The American Ceramic Society.Google Scholar
Srinivasan, R., Harris, M. B., Simpson, S. F., De Angelis, R. J., & Davis, B. H. (1988). J. Mater. Sci. 3, 787797.Google Scholar
Stokes, A. R. & Wilson, A. J. C. (1944). Proc. Phys. Soc. (London), 56, 174181.CrossRefGoogle Scholar
Tani, E., Yoshimura, M. & Somiya, S. (1983). J. Am. Ceram. Soc. 66, 1114.Google Scholar
Toraya, H., Yoshimura, M., & Somiya, S. (1984). J. Am. Ceram. Soc. 67, C119–C121.Google Scholar
Valvoda, V., Kuzel, R., Cerny, R. Jr, & Dobiasova, L. (1988). Mater. Sci. & Eng. A104, 223234.Google Scholar
Vogel, W., Haase, J. & Hosemann, R. (1974). Z. Naturforsch. Teil A, 29, 11521158.Google Scholar
Warren, B. E. & Averbach, B. L. (1950). J. Appl. Phys. 21, 595599.CrossRefGoogle Scholar
Williamson, G. K. & Smallman, R. E. (1956). Phil. Mag. 1, 3446.Google Scholar
Wolten, G. M. (1963). J. Am. Ceram. Soc. 46, 418–22.Google Scholar