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XRPD and Rietveld refinement for Al5NdNi2 compound

Published online by Cambridge University Press:  04 April 2018

Degui Li ,
Kun Luo ,
Bing He ,
Liuqing Liang ,
Ming Qin  and
Tian Lu
Degui Li*
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Kun Luo
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China
Bing He
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Liuqing Liang
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Ming Qin
Affiliation:
School of Materials Science and Engineering, Baise University, Baise, Guangxi 533000, China
Tian Lu
Affiliation:
College of Materials Science and Engineering, Guilin University of Technology, Guilin, Guangxi 541004, China
*
a)Author to whom correspondence should be addressed. Electronic mail: lidegui354@163.com
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Abstract

A new ternary compound Al5NdNi2 was prepared by melting a stoichiometric mixture of aluminum, neodymium, and nickel in an arc furnace and annealing in vacuum. The crystal structure of Al5NdNi2 was studied by X-ray powder diffraction technique and Rietveld analysis. All diffraction lines of Al5NdNi2 were indexed, and the lattice parameters were refined with an orthorhombic structure type of space group Immm (No.71) using Rietveld analysis program DBWS-9807. The lattice parameters are presented, a = 7.0508(1) Å, b = 9.5690(1) Å, c = 3.9792(1) Å, V = 268.47 Å3, Z = 2, ρ = 4.91 g cm−3, and RIR = 1.23.

Keywords

Al5NdNi2X-ray powder diffractionRietveld refinement
Type
New Diffraction Data
Information
Powder Diffraction , Volume 33 , Issue 2 , June 2018 , pp. 172 - 175
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Copyright
Copyright © International Centre for Diffraction Data 2018 

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References

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