Powder Diffraction: Volume 22 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 22 - Issue 2 - June 2007

Contents

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Denver X-Ray Conference

F-35 Invited—Advances in Handheld XRF Designs and Challenges in Meeting Rohs/Weee Directives
S. Afshari, P. Bennett
Published online by Cambridge University Press:

20 May 2016, p. 191
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F-52 Invited—Materials Analysis with Handheld XRF for Compliance with Rohs and Weee Directives—Opportunities and Challenges
S. Piorek
Published online by Cambridge University Press:

20 May 2016, p. 191
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F-12 Characterization of Cdte Detectors for Quantitative X-ray Spectroscopy
R. Redus, J. Pantazis, T. Pantazis, B. Cross
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20 May 2016, p. 191
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F-22 Analysis of “Non-Ideal” Samples by EDXRF for Cr, Hg, Pb, Br and Cd in a Variety of Consumer Electronic Components
R. Kubicek, L. Oelofse, E. Villarreal
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20 May 2016, p. 191
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F-30 Improvement in Detection of Trace Hazardous Materials for Rohs Directive Using a High Efficiency Silicon Drift Detector
L. Feng, C. R. Tull, S. Barkan, V. D. Saveliev, M. Takahashi, N. Matsumori, J. S. Iwanczyk
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20 May 2016, p. 191
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F-53 Sample Preparation and Calibration for a Rohs/Weee Compliant Screening Method (For Ed and Wd XRF)
K. Behrens, A. Seyfarth, J. Sardisco
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20 May 2016, p. 191
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Page 8 of 8

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Powder Diffraction

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Volume 22 - Issue 2 - June 2007

Denver X-Ray Conference

F-35 Invited—Advances in Handheld XRF Designs and Challenges in Meeting Rohs/Weee Directives

F-52 Invited—Materials Analysis with Handheld XRF for Compliance with Rohs and Weee Directives—Opportunities and Challenges

F-12 Characterization of Cdte Detectors for Quantitative X-ray Spectroscopy

F-22 Analysis of “Non-Ideal” Samples by EDXRF for Cr, Hg, Pb, Br and Cd in a Variety of Consumer Electronic Components

F-30 Improvement in Detection of Trace Hazardous Materials for Rohs Directive Using a High Efficiency Silicon Drift Detector

F-53 Sample Preparation and Calibration for a Rohs/Weee Compliant Screening Method (For Ed and Wd XRF)

Powder Diffraction

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Volume 22 - Issue 2 - June 2007

Denver X-Ray Conference

F-35 Invited—Advances in Handheld XRF Designs and Challenges in Meeting Rohs/Weee Directives

F-52 Invited—Materials Analysis with Handheld XRF for Compliance with Rohs and Weee Directives—Opportunities and Challenges

F-12 Characterization of Cdte Detectors for Quantitative X-ray Spectroscopy

F-22 Analysis of “Non-Ideal” Samples by EDXRF for Cr, Hg, Pb, Br and Cd in a Variety of Consumer Electronic Components

F-30 Improvement in Detection of Trace Hazardous Materials for Rohs Directive Using a High Efficiency Silicon Drift Detector

F-53 Sample Preparation and Calibration for a Rohs/Weee Compliant Screening Method (For Ed and Wd XRF)