Powder Diffraction: Volume 22 - Issue 2

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 22 - Issue 2 - June 2007

Contents

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Denver X-Ray Conference

D-112 Invited—In Situ Synchrotron X-ray Studies of Creep Damage
A. Pyzalla, A. Isaac, F. Sket, K. Dzieciol, B. Camin, W. Reimers, T. Buslaps, M. di Michiel
Published online by Cambridge University Press:

20 May 2016, p. 186
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D-11 Real-Space Strain Mapping of Soi Features Using Microbeam X-ray Diffraction
C. E. Murray
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20 May 2016, p. 186
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D-39 in Situ Stress Measurement of Biaxially Strained Aa5754-O
M. A. Iadicola, T. H. Gnaeupel-Herold
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20 May 2016, p. 186
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D-53 Development of a Predictive Life Tool for Tapered Roller Bearings Using Measured Residual Stress and Retained Austenite Data
B. M. Wilson, M. G. Dick
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20 May 2016, p. 186
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D-69 Invited—Insights Into the Deformation Mechanisms of Hcp Materials from a Combination of Diffraction and Micromechanical Modeling
M. R. Daymond, F. Xu, S. Cai, R. A. Holt
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20 May 2016, p. 186
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D-70 Analysis of in Situ Deformation of Hydrided Zircaloy-2 by Synchrotron X-ray Diffraction
M. Kerr, M. R. Daymond, R. A. Holt, J. D. Almer
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20 May 2016, p. 186
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D-78 Elastic Properties of Nano-Structured Thin Films: Characterization and Modeling
G. Geandier, P.-O. Renault, Ph. Goudeau, E. Le Bourhis, P. Villain, B. Girault, O. Castelnau, R. Chiron, R. Randriamazaoro, D. Thiaudie`re
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20 May 2016, p. 186
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D-90 Universal Software for Residual Stress Evaluation from 1D and 2D X-ray Diffraction Data
A. Ulyanenkov
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20 May 2016, p. 186
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F-32 Invited—Handy Waveguide TXRF Spectrometer for Ng Sensitivity
J. Kawai, S. Kunimura
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20 May 2016, p. 187
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F-37 Invited—Xrs, Indoor Aerosols and Human Health
R. Van Grieken, A. Buczynska, B. Horemans, M. Stranger, A. Worobiec
Published online by Cambridge University Press:

20 May 2016, p. 187
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F-57 Invited—Trace Elements for Characterization Artificial Aging Paper
M. L. Carvalho
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20 May 2016, p. 187
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F-11 Grazing Incidence XRF Analysis of Tin Concentration of Glass Surface
T. Yamada, M. Matsuo, N. Kawahara, A. Martin, H. Inoue
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20 May 2016, p. 187
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F-44 Aerosol Filter Analysis Using Scanning Micro X-ray Fluorescence
G. J. Havrilla, V. Montoya, L. Tandon, S. Lamont
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20 May 2016, p. 187
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F-4 Effect of X-ray Tube Power On Intensities of Kα X-Rays of Trace Elements from Samples Obtained by Using Different Sample Preparation Methods in WDXRF Spectrometer
F. Demir, I. Han, G. Budak, L. Demir, A. Gurol, A. Karabulut
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20 May 2016, p. 187
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F-1 TXRF Trace Element Analysis Applied to Authenticity and Purity Control of Pharmaceutical Samples
H. Stosnach, A. Gross
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20 May 2016, p. 187
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C-11 Invited—Low-Power Monochromatic Focused Beam XRF Systems Using Doubly Curved Crystals
Z. W. Chen, F. Wei, B. Beumer, D. Li, W. M. Gibson
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20 May 2016, p. 188
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F-55 a Novel High Resolution Tunable X-ray Fluorescence Imaging Spectrometer for Materials Analysis
S. Seshadri, M. Feser, W. Yun
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20 May 2016, p. 188
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F-45 Small Spot and High Energy Resolution XRF System for Valence State Determination
D. Li, Z. Chen, G. J. Havrilla
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20 May 2016, p. 188
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F-42 Oxidation State Determination Using Xanes Without a Synchrotron
G. J. Havrilla, Z. Chen, D. Li
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20 May 2016, p. 188
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D-41 a New Technique for Three-Dimensional Internal Structure Analysis in Metallic Materials: Coherent X-ray Diffraction Microscopy
Y. Takahashi, Y. Nishino, T. Ishikawa, E. Matsubara
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20 May 2016, p. 188
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Page 6 of 8

First
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2
3
4
5
6
7
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Next »
Last

Powder Diffraction

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Volume 22 - Issue 2 - June 2007

Denver X-Ray Conference

D-112 Invited—In Situ Synchrotron X-ray Studies of Creep Damage

D-11 Real-Space Strain Mapping of Soi Features Using Microbeam X-ray Diffraction

D-39 in Situ Stress Measurement of Biaxially Strained Aa5754-O

D-53 Development of a Predictive Life Tool for Tapered Roller Bearings Using Measured Residual Stress and Retained Austenite Data

D-69 Invited—Insights Into the Deformation Mechanisms of Hcp Materials from a Combination of Diffraction and Micromechanical Modeling

D-70 Analysis of in Situ Deformation of Hydrided Zircaloy-2 by Synchrotron X-ray Diffraction

D-78 Elastic Properties of Nano-Structured Thin Films: Characterization and Modeling

D-90 Universal Software for Residual Stress Evaluation from 1D and 2D X-ray Diffraction Data

F-32 Invited—Handy Waveguide TXRF Spectrometer for Ng Sensitivity

F-37 Invited—Xrs, Indoor Aerosols and Human Health

F-57 Invited—Trace Elements for Characterization Artificial Aging Paper

F-11 Grazing Incidence XRF Analysis of Tin Concentration of Glass Surface

F-44 Aerosol Filter Analysis Using Scanning Micro X-ray Fluorescence

F-4 Effect of X-ray Tube Power On Intensities of Kα X-Rays of Trace Elements from Samples Obtained by Using Different Sample Preparation Methods in WDXRF Spectrometer

F-1 TXRF Trace Element Analysis Applied to Authenticity and Purity Control of Pharmaceutical Samples

C-11 Invited—Low-Power Monochromatic Focused Beam XRF Systems Using Doubly Curved Crystals

F-55 a Novel High Resolution Tunable X-ray Fluorescence Imaging Spectrometer for Materials Analysis

F-45 Small Spot and High Energy Resolution XRF System for Valence State Determination

F-42 Oxidation State Determination Using Xanes Without a Synchrotron

D-41 a New Technique for Three-Dimensional Internal Structure Analysis in Metallic Materials: Coherent X-ray Diffraction Microscopy

Powder Diffraction

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Volume 22 - Issue 2 - June 2007

Denver X-Ray Conference