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Reliability of Complex Devices in Random Environments

Published online by Cambridge University Press:  27 July 2009

E. Çinlar  and
S. Özekici
E. Çinlar
Affiliation:
Department of Civil EngineeringPrinceton University Princeton, New Jersey
S. Özekici
Affiliation:
Department of Industrial EngineeringBosphorus University Bebek, Istanbul, Turkey
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Abstract

The lifetimes of the components of a device depend on each other because of their joint dependence on the environmental conditions. We introduce intrinsic age processes, one for each component, to handle such dependence. The data required can be obtained by experiments under controlled laboratory conditions. The computations needed for randomly varying conditions are recursive and can be used for making decisions regarding maintenance and replacement.

Information

Type
Articles
Information
Probability in the Engineering and Informational Sciences , Volume 1 , Issue 1 , January 1987 , pp. 97 - 115
Copyright
Copyright © Cambridge University Press 1987

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