Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-14T07:00:57.694Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomic time scales TAI and TT(BIPM): present performances and prospects

Published online by Cambridge University Press:  21 October 2010

Gérard Petit
Gérard Petit*
Affiliation:
Bureau International des Poids et Mesures 92312 Sèvres Cedex, France email: gpetit@bipm.org
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

We review the stability and accuracy achieved by the reference atomic time scales TAI and TT(BIPM). We show that they presently are at the level of a few 10−16 in relative value, based on the performance of primary standards, of the ensemble time scale and of the time transfer techniques. We consider how the 1 × 10−16 value could be reached or superseded and which are the present limitations to attain this goal.

Keywords

TimeReference systems
Type
Contributed Papers
Information
Proceedings of the International Astronomical Union , Volume 5 , Highlights H15: Highlights of Astronomy , November 2009 , pp. 220 - 221
Copyright
Copyright © International Astronomical Union 2010

References

Bauch, A., Achkar, J., Bize, S. et al. 2006, Metrologia, 43, 109–120CrossRefGoogle Scholar
Jiang, Z. & Petit, G. 2009, Metrologia, 46–3, 305–314CrossRefGoogle Scholar
Lopez, X., Amy-Klein, A., & Daussy, C. 2008, Eur. Phys. J., D 48, 35–41Google Scholar
Maleki, L. (ed.) 2009, Proc 7th Symp. Freq. Standards and Metrology (World Scientific), 308–313CrossRefGoogle Scholar
Petit, G. 2007, Proc. 21st EFTF conference, 391–394Google Scholar
Petit, G. 2009, Proc. EFTF-IFCS joint conference, 116–119Google Scholar
Samain, E., Weick, J., Vrancken, P. et al. 2008, Int. J. Mod. Phys., D 17-7, 1043CrossRefGoogle Scholar
Seidel, A., Hess, M. P., Kehrer, J. et al. 2008, Proc. 22nd EFTF conferenceGoogle Scholar