Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-13T06:05:33.121Z Has data issue: false hasContentIssue false

Galactic structure from trigonometric parallaxes of star-forming regions

Published online by Cambridge University Press:  26 February 2013

Mark J. Reid*
Affiliation:
Harvard–Smithsonian Center for Astrophysics, Cambridge, MA, USA email: reid@cfa.harvard.edu
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Recently, astrometric accuracy approaching ~ 10 μas has become routinely possible with Very Long Baseline Interferometry. Since, unlike at optical wavelengths, interstellar dust is transparent at radio wavelengths, parallaxes and proper motions can now be measured for massive young stars (with maser emission) across the Galaxy, enabling direct measurements of the spiral structure of the Milky Way. Fitting the full 3D position and velocity vectors to a simple model of the Galaxy yields extremely accurate values for its fundamental parameters, including the distance to the Galactic Center, R0=8.38 ± 0.18 kpc, and circular rotation at the Solar Circle, Θ0 = 243 ± 7 km s−1. The rotation curve of the Milky Way, based for the first time on ‘gold standard’ distances and complete 3D information, appears to be very flat.

Type
Contributed Papers
Copyright
Copyright © International Astronomical Union 2013

References

Dehnen, W. & Binney, J. J. 1998, MNRAS, 298, 387Google Scholar
Honma, M., Bushimata, T., Choi, Y. K., et al. 2007, PASJ, 59, 889Google Scholar
Menten, K. M., Reid, M. J., Forbrich, J., & Brunthaler, A. 2007, A&A, 474, 515Google Scholar
Reid, M. J., Menten, K. M., Zheng, X. W., et al. 2009, ApJ, 700, 137Google Scholar
Reid, M. J., Menten, K. M., Zheng, X. W., Brunthaler, A., & Xu, Y. 2009, ApJ, 705, 1548Google Scholar
Rygl, K. L. J., Brunthaler, A., Reid, M. J., Menten, K. M., van Langevelde, H. J., & Xu, Y. 2010, A&A, 511, 2Google Scholar
Schönrich, R., Binney, J., & Dehnen, W. 2010, MNRAS, 403, 1829Google Scholar
Sivia, D. & Skilling, J. 2006, in: Data Analysis: A Bayesian Tutorial, 2nd ed. (Oxford Univ. Press), p. 168Google Scholar
Xu, Y., Reid, M. J., Zheng, X. W., & Menten, K. M. 2006, Science, 311, 54Google Scholar