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Model Evaluation and Multiple Strategies in Cognitive Diagnosis: An Analysis of Fraction Subtraction Data

Published online by Cambridge University Press:  01 January 2025

Jimmy de la Torre*
Affiliation:
Department of Educational Psychology, Rutgers, The State University of New Jersey
Jeffrey A. Douglas
Affiliation:
Department of Statistics, University of Illinois
*
Requests for reprints should be sent to Jimmy de la Torre, Graduate School of Education, Rutgers, The State University of New Jersey, 10 Seminary Place, New Brunswick, NJ 08901, USA. E-mail: j.delatorre@rutgers.edu

Abstract

This paper studies three models for cognitive diagnosis, each illustrated with an application to fraction subtraction data. The objective of each of these models is to classify examinees according to their mastery of skills assumed to be required for fraction subtraction. We consider the DINA model, the NIDA model, and a new model that extends the DINA model to allow for multiple strategies of problem solving. For each of these models the joint distribution of the indicators of skill mastery is modeled using a single continuous higher-order latent trait, to explain the dependence in the mastery of distinct skills. This approach stems from viewing the skills as the specific states of knowledge required for exam performance, and viewing these skills as arising from a broadly defined latent trait resembling the θ of item response models. We discuss several techniques for comparing models and assessing goodness of fit. We then implement these methods using the fraction subtraction data with the aim of selecting the best of the three models for this application. We employ Markov chain Monte Carlo algorithms to fit the models, and we present simulation results to examine the performance of these algorithms.

Type
Theory and Methods
Copyright
Copyright © 2008 The Psychometric Society

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Footnotes

The work reported here was performed under the auspices of the External Diagnostic Research Team funded by Educational Testing Service. Views expressed in this paper does not necessarily represent the views of Educational Testing Service.

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