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Using Item-Specific Instructional Information in Achievement Modeling

Published online by Cambridge University Press:  01 January 2025

Bengt O. Muthén
Bengt O. Muthén*
Affiliation:
Graduate School of Education, University of California, Los Angeles
*
Requests for reprints should be sent to Bengt O. Muthén, Graduate School of Education, 405 Hilgard Avenue, University of California, Los Angeles, Los Angeles, CA 90024-1521.
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Abstract

The problem of detecting instructional sensitivity (“item basis”) in test items is considered. An illustration is given which shows that for tests with many biased items, traditional item bias detection schemes give a very poor assessment of bias. A new method is proposed instead. This method extends item response theory (IRT) by including item-specific auxiliary measurement information related to opportunity-to-learn. Item-specific variation in measurement relations across students with varying opportunity-to-learn is allowed for.

Keywords

auxiliary informationopportunity-to-learnitem response theorystructural modelingLISCOMP
Type
Original Paper
Information
Psychometrika , Volume 54 , Issue 3 , September 1989 , pp. 385 - 396
Copyright
Copyright © 1989 The Psychometric Society

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Footnotes

This paper was presented at the 1987 AERA meeting in Washington, DC. This research was supported by grant OERI-G-86-003 from the Office of Educational Research and Improvement, Department of Education. The author thanks Michael Hollis and Chih-fen Kao for valuable research assistance, and appreciates valuable comments made by an anonymous reviewer.

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