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W.J. van der Linden (2005). Linear models for optimal test design. NewYork: Springer, xxiv+416 pp., 44 illus., US$89.95. ISBN-10: 0-387-20272-2.

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W.J. van der Linden (2005). Linear models for optimal test design. NewYork: Springer, xxiv+416 pp., 44 illus., US$89.95. ISBN-10: 0-387-20272-2.

Published online by Cambridge University Press:  01 January 2025

Hua-Hua Chang
Hua-Hua Chang*
Affiliation:
University of Illinois at Urbana-Champaign
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Abstract

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Type
Book Review
Information
Psychometrika , Volume 72 , Issue 2 , June 2007 , pp. 279 - 281
Copyright
Copyright © 2007 The Psychometric Society

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References

Chen, P.-H., & Chang, H.H. (under review). A statistical perspective of IRT-based automated test assembly: The cell and cube method.Google Scholar
Lord, F.M., Novick, M.R. (1968). Statistical theories of mental test scores, Reading, MA: Addison-Wesley.Google Scholar