This special issue of Powder Diffraction is dedicated to twenty of the highest quality papers presented at the 2003 Denver X-ray Conference. Publication of regular technical articles and new diffraction data will resume in the June 2004 issue.
In the June 2003 issue of Powder Diffraction, we reported that this journal and the Denver X-ray Conference agreed to a collaboration to better serve the subscribers of Powder Diffraction and attendees of the Denver X-ray Conference. This includes advance publications of both the Denver X-ray Conference program and selected advance articles from the proceedings of the Denver X-ray Conference (namely, Advances in X-ray Analysis) in Powder Diffraction annually. The subscribers of Powder Diffraction will also receive Advances in X-ray Analysis on CD-ROM.
The 52nd Annual Denver X-ray Conference was held in Denver, 4–8 August 2003, attracting over 500 attendees. The first two days of the Conference featured 16 tutorial workshops in X-ray and related fields. The remaining conference week was devoted to seventeen technical sessions. More than 220 papers covering a wide range of subjects in X-ray diffraction, X-ray fluorescence, and special topics in material characterization were presented at these sessions. Sixty of these papers have been accepted and will be published in Volume 47 of Advances in X-ray Analysis.
The Denver X-ray Conference Organizing Committee has selected twenty of the highest quality papers from Volume 47 of Advances in X-ray Analysis for advance publication in this issue. The selected articles are grouped into six categories: X-ray Studies of Art and Archaeological Objects, Powder Diffraction Databases, Powder Diffraction Analysis, Thin Film Analysis, Texture and Stress Analysis, and X-ray Fluorescence Analysis.
We hope that this collaboration between Powder Diffraction and the Denver X-ray Conference will increase the exposure of the best in X-ray analysis to the broader X-ray community in general and to the subscribers of Powder Diffraction in particular.
We are grateful to Dr. Tim Fawcett, Executive Director of ICDD, for facilitating the collaboration between Powder Diffraction and the Denver X-ray Conference. Many thanks to the members of the Denver X-ray Conference Organizing Committee for reviewing and selecting the articles for this issue of Powder Diffraction. Finally, we thank also our authors for their scientific contributions and cooperation.
