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A simple method of monitoring the size, location, and inhomogeneity of the incident X-ray beam in a powder diffractometer
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- Journal:
- Powder Diffraction / Volume 21 / Issue 3 / September 2006
- Published online by Cambridge University Press:
- 01 March 2012, pp. 248-249
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Handy waveguide TXRF spectrometer for nanogram sensitivity
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- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 29 February 2012, pp. 146-149
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