Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.
